Conventional test - appearance, size, electrical performance, security, performance and other major test of electronic components; reliability testing - life and environmental testing is mainly to test electronic components; DPA analysis - mainly for the internal structure and process of the device will be to control. Conventional test: According to specification test basic parameters of the device, such as transistors, to test appearance, size, ICBO, VCEO, VCES, HFE, pull the pin, the pin bent, weldability, resistance to soldering heat and other projects, part of the export product Also test RoHS. Reliability testing: According to life and a variety of environmental test consumer requirements and specification requirements for test devices, such as transistors, to a high temperature test, low temperature test, tidal state test, vibration test, the maximum load test, high-temperature durability test and other tests of the project; DPA analysis: such as the transistor, the primary means of X-ray monitor internal structure, internal structure and acoustic sweep monitor packaging technology, Kaifeng monitor internal wafer structure and size and so on.